The growth and atomic structure of the Si(1 1 1)-indium interface studied by surface X-ray diffraction
- 1 April 1994
- journal article
- Published by Elsevier in Physica B: Condensed Matter
- Vol. 198 (1-3) , 246-248
- https://doi.org/10.1016/0921-4526(94)90171-6
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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