Application of proton-induced X-ray emission to quantitative trace element analysis
- 15 April 1977
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 142 (1-2) , 21-26
- https://doi.org/10.1016/0029-554x(77)90801-1
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Bremsstrahlung induced by proton and-ion bombardments in the 1-4-MeV/amu energy rangePhysical Review A, 1976
- Analysis of biological, clinical, and environmental samples using proton-induced x-ray emissionAnalytical Chemistry, 1974
- Target backings for charged particle induced X-ray fluorescence analysisNuclear Instruments and Methods, 1973
- A comparative study of alpha and X-ray induced X-ray emission for elemental analysisNuclear Instruments and Methods, 1973
- Comparison of particle and photon excited X-ray fluorescence applied to trace element measurements of environmental samplesNuclear Instruments and Methods, 1973
- Sensitivity versus target backings for elemental analysis by alpha excited X-ray emissionNuclear Instruments and Methods, 1972
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- Excitation of Characteristic X Rays by Protons, Electrons, and Primary X RaysJournal of Applied Physics, 1964