Spare allocation and reconfiguration in large area VLSI

Publisher Website

6 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/dac.1988.14826

Abstract

No abstract available

This publication has 3 references indexed in Scilit:

Increased throughput for the testing and repair of RAMs with redundancy
IEEE Transactions on Computers, 1991
Efficient Spare Allocation for Reconfigurable Arrays
IEEE Design & Test of Computers, 1987
A review of fault-tolerant techniques for the enhancement of integrated circuit yield
Proceedings of the IEEE, 1986