Numerical analysis of InP/InGaAsP ARROW waveguides using transfer matrix approach
- 1 June 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Journal of Lightwave Technology
- Vol. 10 (6) , 767-771
- https://doi.org/10.1109/50.143076
Abstract
The transfer matrix method is employed to analyze the modal propagation within planar InP/InGaAsP antiresonant reflecting optical waveguides (ARROW) at the operational wavelength of 1.55 mu m. The numerical results provide an accurate picture of dispersion and attenuation of both TE and TM polarized waves. Spatial properties of the modes are also investigated and detailed plots of the variation of electric field amplitude with layer thickness are given.Keywords
This publication has 12 references indexed in Scilit:
- Modal propagation within ARROW waveguidesOptics Communications, 1990
- High efficiency light coupling from antiresonant reflecting optical waveguide to integrated photodetector using an antireflecting layerApplied Optics, 1990
- Monolithic integration of an ARROW-type demultiplexer and photodetector in the shorter wavelength regionJournal of Lightwave Technology, 1990
- Analysis of arrow waveguidesOptics Communications, 1989
- Loss reduction of an ARROW waveguide in shorter wavelength and its stack configurationJournal of Lightwave Technology, 1988
- Vertically grating-coupled ARROW structures for III--V integrated opticsIEEE Journal of Quantum Electronics, 1987
- Spectral dependence of propagation loss in InP/InGaAsP antiresonant reflecting optical waveguides grown by chemical beam epitaxyApplied Physics Letters, 1987
- Thin-films field-transfer matrix theory of planar multilayer waveguides and reflection from prism-loaded waveguidesJournal of the Optical Society of America A, 1984
- Threshold dependence on active-layer thickness in InGaAsP/InP d.h. lasersElectronics Letters, 1978
- Refractive Index of InPJournal of Applied Physics, 1965