Amdahl chip delay test system
- 10 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 200-205
- https://doi.org/10.1109/iccd.1991.139881
Abstract
No abstract availableKeywords
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- On the detection of delay faultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
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- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966