Delay test generation. II. Algebra and algorithms

This publication has 8 references indexed in Scilit:

• Random pattern testability of delay faults
  IEEE Transactions on Computers, 1988
• On Delay Fault Testing in Logic Circuits
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1987
• Transition Fault Simulation
  IEEE Design & Test of Computers, 1987
• On the Acceleration of Test Generation Algorithms
  IEEE Transactions on Computers, 1983
• 9-V Algorithm for Test Pattern Generation of Combinational Digital Circuits
  IEEE Transactions on Computers, 1978
• A Nine-Valued Circuit Model for Test Generation
  IEEE Transactions on Computers, 1976
• Diagnosis & Reliable Design of Digital Systems
  Published by Springer Nature ,1976
• Diagnosis of Automata Failures: A Calculus and a Method
  IBM Journal of Research and Development, 1966