Migration of sulphate ions in anodic alumina

This publication has 15 references indexed in Scilit:

• A novel approach for the study of the migration of Cl− ions in anodic alumina
  Corrosion Science, 1999
• Influence of surface roughness on the depth resolution of GDOES depth profiling analysis
  Surface and Interface Analysis, 1999
• Impurity distributions in barrier anodic films on aluminium: a GDOES depth profiling study
  Electrochimica Acta, 1999
• Glow discharge optical emission spectrometry (GDOES) depth profiling analysis of anodic alumina films—a depth resolution study
  Surface and Interface Analysis, 1999
• Anodic oxide films on tantalum: Incorporation and mobilities of electrolyte-derived species
  Philosophical Magazine Part B, 1996
• A Model for the Incorporation of Electrolyte Species into Anodic Alumina
  Journal of the Electrochemical Society, 1996
• The compositions of barrier-type anodic films formed on aluminium in molybdate and tungstate electrolytes
  Philosophical Transactions A, 1995
• Direct observations of ion-implanted xenon marker layers in anodic barrier films on aluminium
  Thin Solid Films, 1982
• The Use of Rutherford Backscattering to Study the Behavior of Ion-Implanted Atoms During Anodic Oxidation of Aluminum: Ar, Kr, Xe, K, Rb, Cs, Cl, Br, and l
  Journal of the Electrochemical Society, 1973
• The mechanism of anodic oxidation
  Journal of Physics and Chemistry of Solids, 1962