Large scanning area near field optical microscopy
- 1 October 1998
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 69 (10) , 3614-3617
- https://doi.org/10.1063/1.1149147
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Probe-surface interaction in near-field optical microscopy: The nonlinear bending force mechanismApplied Physics Letters, 1996
- Direct measurements of the true vibrational amplitudes in shear force microscopyApplied Physics Letters, 1995
- A nonoptical tip–sample distance control method for near-field scanning optical microscopy using impedance changes in an electromechanical systemReview of Scientific Instruments, 1995
- Piezoelectric tip-sample distance control for near field optical microscopesApplied Physics Letters, 1995
- Minimum detectable displacement in near-field scanning optical microscopyApplied Physics Letters, 1994
- Near field measurements of optical channel waveguides and directional couplersApplied Physics Letters, 1994
- Atomic resolution with an atomic force microscope using piezoresistive detectionApplied Physics Letters, 1993
- Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction LimitScience, 1992
- Near-field differential scanning optical microscope with atomic force regulationApplied Physics Letters, 1992
- Combined shear force and near-field scanning optical microscopyApplied Physics Letters, 1992