Electron-impurity tunneling in selectively doped n-type AlxGa1xAs/GaAs heterostructures

Abstract
The interaction of the two-dimensional electron gas at the semiconductor interface of a selectively doped n-type Alx Ga1xAs/GaAs heterostructure grown by molecular-beam epitaxy with empty impurity levels in the Alx Ga1xAs layer is investigated both experimentally and theoretically. The electron subband energy levels in the triangular potential well of the heterostructure are calculated by a new method and are in excellent agreement with other approaches. The calculation of the electron-impurity tunneling process is based on a square-well potential shape to obtain solutions in an analytic and not in a numerical form. For experimental investigations we used time-resolved Hall effect and conductivity measurements combined with excitation by monochromatic illumination of the sample. The decay of the carrier concentration after illumination is monitored for more than 3 days at temperatures ranging from 20 to 150 K and is conclusively found to be nonexponential. Extrapolation of the decay to the dark concentration yields a total lifetime of photoconductivity of more than 1012 s at T<eq77 K. The optical threshold energies of 0.95<eqEdo<eq1.10 eV for persistent photoconductivity coincides with the values for transient photoconductivity. This result demonstrates that both parts of the photoconductivity are caused by the same deep Si donor in the Alx Ga1xAs layer. The relative contributions to persistent photoconductivity of electron excitation from the deep Si donor in the Alx Ga1xAs layer as well as electron-hole generation in the GaAs layer are determined for a specific alloy composition of Alx Ga1xAs. Electron-hole generation in the GaAs layer contributes only a minor part to the observed persistent photoconductivity of the heterostructure for alloy compositions x>eq0.3.