The impact of NMOSFET hot-carrier degradation on CMOS analog subcircuit performance
- 1 June 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 30 (6) , 644-649
- https://doi.org/10.1109/4.387067
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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