The electrical assessment of p-isotype Si/SiGe/Si heterostructures grown by MBE
- 1 December 1992
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 222 (1-2) , 116-119
- https://doi.org/10.1016/0040-6090(92)90050-l
Abstract
No abstract availableKeywords
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