Strain distribution in self-assembled InP/GaInP quantum dots
- 15 July 2000
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 88 (2) , 710-715
- https://doi.org/10.1063/1.373726
Abstract
Local strain on an atomic scale, as well as the size and the shape of InP quantum dots(QDs) embedded in GaInP, have been measured directly from high-resolution electron microscopy images. There is a strong spatial variation in strain within a QD. A large part of the misfit strain is distributed in the GaInP matrix surrounding the QDs, especially in the case of small spacing between the QD layers. The strain distribution varies significantly with the thickness of the GaInP spacer layers between QD layers. The compressive strain within the QDs decreases with decreasing spacing between the QD layers. This contributes to an increasing red shift of photoluminescence energy peak positions of QDs of multi-layers with decreasing thickness of the spacer layers between the QD layers in comparison with that of single layer QDs.This publication has 13 references indexed in Scilit:
- Geometry and material parameter dependence of InAs/GaAs quantum dot electronic structurePhysical Review B, 1999
- InAs quantum dots: Predicted electronic structure of free-standing versus GaAs-embedded structuresPhysical Review B, 1999
- Photoluminescence measurements of InP quantum dots in pulsed magnetic fieldsPhysica B: Condensed Matter, 1998
- Strain distribution and electronic spectra of InAs/GaAs self-assembled dots: An eight-band studyPhysical Review B, 1997
- Determination of segregation, elastic strain and thin-foil relaxation in InxGa-1-x As islands on GaAs(001) by high resolution transmission electron microscopyPhilosophical Magazine Letters, 1996
- Electronic structure of InAs/GaAs self-assembled quantum dotsPhysical Review B, 1996
- Structural and optical characterization of InP/GalnP islands grown by solid-source MBEJournal of Electronic Materials, 1996
- Vertically Aligned and Electronically Coupled Growth Induced InAs Islands in GaAsPhysical Review Letters, 1996
- Strained state of Ge(Si) islands on Si: Finite element calculations and comparison to convergent beam electron-diffraction measurementsApplied Physics Letters, 1994
- Chemical Mapping of Semiconductor Interfaces at Near-Atomic ResolutionPhysical Review Letters, 1989