Minimal Redundant Logic for High Reliability and Irredundant Testability
- 1 July 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-29 (7) , 648-656
- https://doi.org/10.1109/tc.1980.1675636
Abstract
The procedures introduced in this paper convert redundant circuits into irredundant circuits for testing purposes. In a redundant circuit, there are redundant connections which contribute no unique l's or 0's to the output of the circuit. These redundant connections are contained in the circuit for specific purposes, such as hazard protection, integrated circuit standardization, structural purposes, correct operation in the presence of faults, and other reasons. Most faults on these redundant connections cannot be detected due to the unchanging output. An irredundant circuit contains no redundant connections and all lines are completely testable.Keywords
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