Field-ion microscopy of GaAs and GaP
- 1 December 1977
- journal article
- Published by Elsevier in Surface Science
- Vol. 69 (2) , 521-532
- https://doi.org/10.1016/0039-6028(77)90131-5
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Field ion microscopy of germanium: Field ionization and surface statesSurface Science, 1975
- Field-ion microscopy of siliconSurface Science, 1975
- The -Oriented Whiskers of β–SiC Studied by the Field Emission and Field Ion MicroscopesJapanese Journal of Applied Physics, 1975
- Study of germanium in the field ion microscopeSurface Science, 1972
- Field emission from GaPPhysica Status Solidi (a), 1970
- Gallium Arsenide Surface Structure and Reaction Kinetics: Field Emission MicroscopyJournal of Applied Physics, 1966
- Gas-Surface Interactions and Field-Ion Microscopy of Nonrefractory MetalsJournal of Applied Physics, 1965
- Whisker Crystals of Gallium Arsenide and Gallium Phosphide Grown by the Vapor—Liquid—Solid MechanismJournal of Applied Physics, 1965
- Study of the Filamentary Growth of Silicon Crystals from the VaporJournal of Applied Physics, 1964
- Vapor Phase Preparation of Gallium Phosphide CrystalsJournal of the Electrochemical Society, 1961