NIRSE: Normal-incidence rotating-sample ellipsometer
- 31 March 1977
- journal article
- Published by Elsevier in Optics Communications
- Vol. 20 (3) , 405-408
- https://doi.org/10.1016/0030-4018(77)90215-2
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- PIE: Perpendicular-incidence ellipsometry—application to the determination of the optical properties of uniaxial and biaxial absorbing crystalsOptics Communications, 1976
- Precision Bounds to Ellipsometer SystemsApplied Optics, 1975
- Ellipsometry of anisotropic thin filmsJournal of the Optical Society of America, 1974
- Design and Operation of ETA, an Automated EllipsometerIBM Journal of Research and Development, 1973
- Fourier transform detection system for rotating-analyzer ellipsometersOptics Communications, 1973
- A modulated ellipsometer for studying thin film optical properties and surface dynamicsSurface Science, 1973