PIE: Perpendicular-incidence ellipsometry—application to the determination of the optical properties of uniaxial and biaxial absorbing crystals
- 31 October 1976
- journal article
- Published by Elsevier in Optics Communications
- Vol. 19 (1) , 122-124
- https://doi.org/10.1016/0030-4018(76)90401-6
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Application of generalized ellipsometry to anisotropic crystals*Journal of the Optical Society of America, 1974
- Ellipsometry of anisotropic surfacesJournal of the Optical Society of America, 1973
- Ellipsometric determination of the optical anisotropy of gallium selenideJournal of the Optical Society of America, 1973
- Generalized Ellipsometry for Surfaces with Directional Preference: Application to Diffraction Gratings*Journal of the Optical Society of America, 1972
- Ellipsometric Measurement of the Polarization Transfer Function of an Optical System*Journal of the Optical Society of America, 1972
- Polarization Transfer Function of an Optical System as a Bilinear Transformation*Journal of the Optical Society of America, 1972
- Determination of the Optical Constants of Anisotropic Crystals*Journal of the Optical Society of America, 1969
- Optical Properties of Vanadium Pentoxide*Journal of the Optical Society of America, 1967