Impact ionization in Ga1−xAlxSb
- 15 June 1992
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 60 (24) , 3030-3032
- https://doi.org/10.1063/1.106799
Abstract
We have measured impact ionization rates in Ga1−xAlxSb at x=0 and 0.08. For these Al contents, the ratio values of the spin-orbit splitting energy Δ to the energy gap Eg are, respectively, greater and lower than unity. We have determined that the ratio of the ionization coefficients kp/kn is greater than unity for both compositions and that it is much lower (kp/kn≊2) than the value (≳10) determined on our layers for x=0.04. Multiplication noise measurements confirm these results. The comparison to other published data show that the ionization in these antimonide compounds is not yet elucidated.Keywords
This publication has 13 references indexed in Scilit:
- Impact ionization rates of holes in AlxGa1−xSbJournal of Applied Physics, 1991
- Be+ ion implantation in Ga0.96Al0.04Sb epitaxial layersJournal of Applied Physics, 1990
- Measurement of the impact ionization rates in Al0.06Ga0.94SbApplied Physics Letters, 1990
- Hole impact ionization enhancement in AlxGa1−xSbJournal of Applied Physics, 1990
- High-purity GaSb epitaxial layers grown from Sb-rich solutionsApplied Physics Letters, 1990
- AlGaSb avalanche photodiode exhibiting a very low excess noise factorApplied Physics Letters, 1989
- Liquid phase epitaxial growth of AlxGa1−xSb from Sb-rich solutionJournal of Crystal Growth, 1989
- A model for impact ionisation in wide-gap semiconductorsJournal of Physics C: Solid State Physics, 1983
- Impact ionization in Ga1-xAlxSb: An alternative interpretationIEEE Journal of Quantum Electronics, 1981
- Ga1-xAlxSb avalanche photodiodes: Resonant impact ionization with very high ratio of ionization coefficientsIEEE Journal of Quantum Electronics, 1981