Neutron-induced soft error simulator and its accurate predictions
- 22 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
- Impact of cosmic ray neutron induced soft errors on advanced submicron CMOS circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Measurements and analysis of neutron-reaction-induced charges in a silicon surface regionIEEE Transactions on Nuclear Science, 1997
- Single-event effects in avionicsIEEE Transactions on Nuclear Science, 1996
- Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1996
- Accelerated testing for cosmic soft-error rateIBM Journal of Research and Development, 1996
- Accurate, predictive modeling of soft error rate due to cosmic rays and chip alpha radiationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1994
- CMOS-SRAM soft-error simulation systemPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1994
- Momentum distribution of fragments in heavy-ion reactions: Dependence on the stochastic collision processPhysical Review C, 1993
- Antisymmetrized Version of Molecular Dynamics with Two-Nucleon Collisions and Its Application to Heavy Ion ReactionsProgress of Theoretical Physics, 1992
- THE STOPPING AND RANGE OF IONS IN SOLIDSPublished by Elsevier ,1988