Characterization of multilayers as monochromators using 200–900 eV synchrotron radiation
- 1 December 1986
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 253 (1) , 135-144
- https://doi.org/10.1016/0168-9002(86)91137-x
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
- Automatic Electron-Beam Deposition Of Multilayer Soft X-Ray Coatings With Laterally Graded D-SpacingOptical Engineering, 1986
- The fabrication of multilayers for soft X-rays and extreme ultra-violet mirrorsJournal of Optics, 1984
- Monochromator crystals for synchrotron radiation use in the energy region 550–5000 eVNuclear Instruments and Methods in Physics Research, 1983
- VUV and soft X-ray monochromators for use with synchrotron radiationNuclear Instruments and Methods in Physics Research, 1983
- New monochromator designs for the soft x-ray rangeNuclear Instruments and Methods in Physics Research, 1982
- Stability of some soft x-ray monochromator crystals in synchrotron radiationNuclear Instruments and Methods in Physics Research, 1982
- The plane grating and elliptical mirror: A new optical configuration for monochromatorsOptics Communications, 1982
- Long-wave X-ray radiation mirrorsOptics Communications, 1981
- Identification of “spurious” reflections in “channel-cut” monochromatorsNuclear Instruments and Methods, 1980
- Close Similarity between Photoelectric Yield and Photoabsorption Spectra in the Soft-X-Ray RangePhysical Review Letters, 1972