Study on the ZrO2–Y2O3/Fe interface
- 1 July 1998
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 133 (3) , 184-188
- https://doi.org/10.1016/s0169-4332(98)00195-0
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- X-ray photoelectron spectroscopic studies on ceramic composites containing yttria-stabilized zirconia and aluminaApplied Surface Science, 1993
- Characterization of zirconium dioxide film formed by plasma enhanced metal-organic chemical vapor depositionThin Solid Films, 1993
- Microanalyses of Ar+ -bombarded zirconia-yttria films on silicon substratesThin Solid Films, 1992
- YBa2Cu3O7−δ films on Si with Y-stabilized ZrO2 and Y2O3 buffer layers: High-resolution electron microscopy of the interfacesApplied Physics Letters, 1992
- Compositions of deposited films using ion beam sputtering Zr with reactive oxygenMaterials Research Bulletin, 1992
- X-ray photoelectron spectroscopy studies of the surface of ion-beam reactive sputter deposited zirconia filmsJournal of Materials Science Letters, 1992
- An x-ray photoelectron spectroscopy investigation of the incorporation of surface oxides into bulk zirconiumJournal of Vacuum Science & Technology A, 1987
- Surface analysis of chemically etched zirconiumThin Solid Films, 1986
- Thermodynamic Constraints on Ion Beam Mixing of Metals on InsulatorsMRS Proceedings, 1985
- Structural disorder and phase transitions in ZrO2-Y2O3 systemJournal of Physics and Chemistry of Solids, 1981