On the evaluation of absorption data from soft X-ray self-absorption measurements
- 1 June 1983
- journal article
- Published by IOP Publishing in Journal of Physics F: Metal Physics
- Vol. 13 (6) , 1325-1332
- https://doi.org/10.1088/0305-4608/13/6/030
Abstract
An improved method is given for extracting absorption information from soft X-ray emission spectra using the Gaussian expression recently proposed by Packwood and Brown (1981) for the ionisation as a function of depth for an electron beam in an X-ray target. Quantitative agreement is found with attenuation coefficients measured directly.Keywords
This publication has 18 references indexed in Scilit:
- Quantitative electron probe microanalysis using Gaussian ϕ(ρz) CurvesX-Ray Spectrometry, 1982
- Soft X-ray emission and self-absorption spectra from BCC solid solutions of Mg in Li-an experimental studyJournal of Physics F: Metal Physics, 1982
- Self-absorption and the soft X-ray edges of Be metalJournal of Physics F: Metal Physics, 1980
- Self-absorption studies of the soft X-ray emission and absorption edges of K, Mg, Al and BeJournal of Physics F: Metal Physics, 1980
- Self-absorption and the effect of exciting voltage on the soft X-ray emission edge of Li and other light metalsPhilosophical Magazine, 1977
- X‐ray production as a function of depth for low electron energiesX-Ray Spectrometry, 1976
- The prospects for an improved absorption correction in electron probe microanalysisJournal of Physics D: Applied Physics, 1974
- Multiple scattering of 5 - 30 keV electrons in evaporated metal films III: Backscattering and absorptionBritish Journal of Applied Physics, 1965
- The angular distribution of characteristic x radiation and its origin within a solid targetProceedings of the Physical Society, 1964
- Sur les bases physiques de l'analyse ponctuelle par spectrographie XJournal de Physique et le Radium, 1955