Easily Testable Iterative Systems
- 1 December 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-22 (12) , 1061-1064
- https://doi.org/10.1109/t-c.1973.223651
Abstract
It has been shown that the number of tests required to detect all faults in a one-dimensional unilateral combinational iterative array consisting of p cells will, in general, be proportional to p. In this paper we consider properties of such systems that enable them to be tested with a fixed constant number of tests independent of p, the number of cells in the system. Such systems are referred to as C-testable. Necessary and sufficient conditions on the basic cell state table are derived for an iterative system to be C-testable. It is shown that an arbitrary N-state cell table can be augmented by the addition of, at most, one row and less than [log2 N]2 columns (for N ≥ 2) so as to be C-testable.Keywords
This publication has 3 references indexed in Scilit:
- Fault Detection in Iterative Logic ArraysIEEE Transactions on Computers, 1971
- Universal Single Transition Time Asynchronous State AssignmentsIEEE Transactions on Computers, 1969
- Testing for faults in combinational cellular logic arraysPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1967