An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces
- 1 July 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 93 (1-2) , 161-169
- https://doi.org/10.1016/0040-6090(82)90101-8
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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