FT-IR characterization of SiH bonds on the surface of silicon carbide.
- 31 May 1988
- journal article
- Published by Elsevier in Journal of Molecular Structure
- Vol. 174, 369-374
- https://doi.org/10.1016/0022-2860(88)80186-8
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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