Impurity centers in PN junctions determined from shifts in the thermally stimulated current and capacitance response with heating rate
- 31 January 1972
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 15 (1) , 69-79
- https://doi.org/10.1016/0038-1101(72)90068-8
Abstract
No abstract availableKeywords
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