Accuracy of theoretical predictions concerning the location of the cross-over points on the secondary-electron emission yield curve
- 1 September 1981
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 52 (9) , 5800-5802
- https://doi.org/10.1063/1.329472
Abstract
A series of accurate measurements of the secondary-electron emission properties of a range of amorphous materials, carried out under stringent experimental conditions, have allowed an empirical test of the accuracy of the theoretical expressions derived by Dionne for the locations of the cross-over points on the yield curve. These expressions are found to be in good agreement with observation.This publication has 14 references indexed in Scilit:
- An experimental assessment of proposed universal yield curves for secondary electron emissionJournal of Physics D: Applied Physics, 1980
- Compact multi-specimen cleavage and rotation mechanism for secondary-emission studiesJournal of Physics E: Scientific Instruments, 1978
- Origin of secondary-electron-emission yield-curve parametersJournal of Applied Physics, 1975
- Effects of secondary electron scattering on secondary emission yield curvesJournal of Applied Physics, 1973
- Transmission Secondary Emission from Low Density Deposits of InsulatorsPublished by Elsevier ,1962
- Contribution of Backscattered Electrons to Secondary Electron FormationPhysical Review B, 1961
- Variation of Secondary Emission with Primary Electron EnergyProceedings of the Physical Society, 1958
- Dissipation of Energy by 2.5–10 kev Electrons in Al2O3Journal of Applied Physics, 1957
- Penetration of Electrons in Aluminum Oxide FilmsPhysical Review B, 1956
- Transmission of 0-40 kev Electrons by Thin Films with Application to Beta-Ray SpectroscopyPhysical Review B, 1954