Problems relevant to quality conformance inspection of semiconductor electronic parts
- 1 January 1976
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 15 (3) , 191-211
- https://doi.org/10.1016/0026-2714(76)90753-8
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Results of reliability tests on planar transistorsMicroelectronics Reliability, 1968
- New developments in thermocompression bondingMicroelectronics Reliability, 1966
- Welded and bonded connexions for microelectronicsMicroelectronics Reliability, 1966
- The reliability of integrated circuitsMicroelectronics Reliability, 1966
- Expanded contacts and interconnexions to monolithic silicon integrated circuitsSolid-State Electronics, 1965