X-ray diffraction from mesoscopic systems: thin films on 'rough' surfaces

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Abstract
In this work X-ray diffraction measurements on thin polystyrene films deposited on laterally structured surfaces are reported. The experiments were performed in the region of small incidence and exit angles. The X-ray data are compared with the results of atomic force microscopy investigations, both being performed to obtain the morphology of the polymer film on top of the surface grating. Our results do not confirm existing theoretical predictions assuming pure van der Waals interactions between the substrate and the film.