X-ray diffraction from laterally structured surfaces: Crystal truncation rods
- 15 June 1994
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 75 (12) , 7761-7769
- https://doi.org/10.1063/1.356609
Abstract
No abstract availableThis publication has 34 references indexed in Scilit:
- Investigations of semiconductor superlattices by depth-sensitive x-ray methodsJournal of Applied Physics, 1993
- The Ge(001) (2 × 1) reconstruction: asymmetric dimers and multilayer relaxation observed by grazing incidence X-ray diffractionSurface Science, 1992
- Au/Si(111): Analysis of the (√3 × √3 )R30° and 6×6 structures by in-plane x-ray diffractionPhysical Review B, 1991
- Surface x-ray-scattering measurements of the substrate-induced spatial modulation of an incommensurate adsorbed monolayerPhysical Review B, 1990
- Surface structure determination by X-ray diffractionSurface Science Reports, 1989
- Crystal truncation rods and surface roughnessPhysical Review B, 1986
- Scattering of X-rays from crystal surfacesJournal of Physics C: Solid State Physics, 1985
- Model-Independent Structure Determination of the InSb(111)2×2 Surface with Use of Synchrotron X-Ray DiffractionPhysical Review Letters, 1985
- Direct Determination of the Au(110) Reconstructed Surface by X-Ray DiffractionPhysical Review Letters, 1983
- Die äußere Form der Kristalle in ihrem Einfluß auf die Interferenzerscheinungen an RaumgitternAnnalen der Physik, 1936