Thermally driven reliability issues in microelectronic systems: status-quo and challenges
- 1 December 2003
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 43 (12) , 1969-1974
- https://doi.org/10.1016/s0026-2714(03)00183-5
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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