Vinyl ether formulations for step and flash imprint lithography
- 1 November 2005
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 23 (6) , 2967-2971
- https://doi.org/10.1116/1.2131881
Abstract
Acrylates have been used as patterning monomers in step and flash imprint lithography. Vinyl ether formulations have a lower viscosity, faster curing rate, and higher tensile strength than acrylate formulations. However, the lack of commercially available, silicon-containing vinyl ether monomers has required the synthesis of several new vinyl ethers. An ideal monomer has low viscosity and low vapor pressure. The vapor pressure of silicon-containing vinyl ethers was predicted using the Joback-Reid, Lyderson, and Lee-Kesler methods. BVMDSO (1,1,3,3-tetramethyl-1,3-bis(vinyloxymethyl)-disiloxane) has the lowest viscosity of the synthesized silicon-containing vinyl ethers that meet the volatility requirement for a 80 pl dispense volume. The formulation of BVMDSO, CHDVE (cyclohexanedimethanol divinyl ether), and TEGDVE (triethylene glycol divinyl ether) shows good tensile strength and modulus. The formulation of BVMDSO, CHDVE, TEGDVE, and fluorinated acetate can print a 30 nm line because it has a low separation force and high tensile modulus.Keywords
This publication has 11 references indexed in Scilit:
- Vinyl ethers in ultraviolet curable formulations for step and flash imprint lithographyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2004
- Imprint lithography for integrated circuit fabricationJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2003
- Measurement of Adhesive Force Between Mold and Photocurable Resin in Imprint TechnologyJapanese Journal of Applied Physics, 2002
- Step and flash imprint lithography: Defect analysisJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2001
- Step and flash imprint lithography for sub-100-nm patterningPublished by SPIE-Intl Soc Optical Eng ,2000
- Step and flash imprint lithography: a new approach to high-resolution patterningPublished by SPIE-Intl Soc Optical Eng ,1999
- Estimation of normal boiling points from group contributionsJournal of Chemical Information and Computer Sciences, 1994
- Radiation-Induced Cationic Curing of Vinyl EthersPublished by Springer Nature ,1992
- ESTIMATION OF PURE-COMPONENT PROPERTIES FROM GROUP-CONTRIBUTIONSChemical Engineering Communications, 1987
- A generalized thermodynamic correlation based on three‐parameter corresponding statesAIChE Journal, 1975