Static logic implication with application to redundancy identification

This publication has 15 references indexed in Scilit:

• Recursive Learning: An attractive alternative to the decision tree for test generation in digital ci
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Test generation for ultra-large circuits using ATPG constraints and test-pattern templates
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Low-cost redundancy identification for combinational circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• FIRE: a fault-independent combinational redundancy identification algorithm
  IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1996
• A transitive closure algorithm for test generation
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1993
• PROOFS: a fast, memory-efficient sequential circuit fault simulator
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1992
• A transitive closure based algorithm for test generation
  Published by Association for Computing Machinery (ACM) ,1991
• SOCRATES: a highly efficient automatic test pattern generation system
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
• On the Acceleration of Test Generation Algorithms
  IEEE Transactions on Computers, 1983
• A Deductive Method for Simulating Faults in Logic Circuits
  IEEE Transactions on Computers, 1972