A reliability model for a k-out-of-N:G redundant system with multiple failure modes and common cause failures
- 1 January 1987
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 27 (4) , 621-623
- https://doi.org/10.1016/0026-2714(87)90004-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A k-out-of-N:G three-state unit redundant system with common-cause failures and replacementsMicroelectronics Reliability, 1981
- Unified availability modeling: A redundant system with mechanical, electrical, software, human and common-cause failuresMicroelectronics Reliability, 1981
- Multi-state device redundant systems with common-cause failures and one standby unitMicroelectronics Reliability, 1980
- On common-cause failures—BibliographyMicroelectronics Reliability, 1978