Study of single-electron excitations by electron microscopy II. Cathodoluminescence image contrast from localized energy transfers
- 1 June 1980
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 41 (6) , 809-827
- https://doi.org/10.1080/01418618008243890
Abstract
Observations of cathodoluminescence in ZnS single crystals using scanning transmission electron microscopy exhibit a dependence on crystal orientation indicating that about 20% of the signal originates in localized excitations. This figure can be explained in terms of energy transfer to valence excitations from energetic secondary electrons ejected from inner shells. Similar effects may operate in electron-beam-induced-conductivity images, X-ray production and other processes.Keywords
This publication has 12 references indexed in Scilit:
- Observation of cathodoluminescence at single dislocations by STEMPhilosophical Magazine A, 1980
- The orientation dependence of measured inelastic scattering probabilities for fast electrons in single crystalsJournal of Physics D: Applied Physics, 1979
- Study of single-electron excitations by electron microscopy I. Image contrast from delocalized excitationsPhilosophical Magazine A, 1978
- Branch points and the critical voltage effect in high-energy electron diffraction (Band theory models)Journal of Physics C: Solid State Physics, 1977
- Electron excitation and the optical potential in electron microscopyPhilosophical Magazine, 1977
- Electron Slowing-Down Spectrum in Irradiated SiliconPhysical Review B, 1973
- Relativistic Hartree–Fock X-ray and electron scattering factorsActa Crystallographica Section A, 1968
- On the production of characteristic X-rays in thin metal crystalsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1966
- Enhanced X-ray emission from extinction contours in a single-crystal gold filmPhilosophical Magazine, 1962
- On the production of X-rays in thin metal foilsPhilosophical Magazine, 1962