Resolving Power of the Scanning Electron Microscope

This publication has 7 references indexed in Scilit:

• Electron Gun Using a Field Emission Source
  Review of Scientific Instruments, 1968
• The multiple emission of electrons in a secondary-electron particle counter
  British Journal of Applied Physics, 1967
• Scanning Electron Microscopes: Is High Resolution Possible?
  Science, 1966
• Secondary Emission Statistics Their Application to the Windowless Multipliers
  IEEE Transactions on Nuclear Science, 1964
• Determination of the Probability Distribution of the Number of Secondary Electrons
  IEEE Transactions on Nuclear Science, 1964
• Contribution of Backscattered Electrons to Secondary Electron Formation
  Physical Review B, 1961
• The Probability of Multiple Emissions of Secondary Electrons
  Proceedings of the Physical Society, 1958