Proton-induced x-ray emission analysis of thick targets—A new approach
- 1 October 1978
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 33 (7) , 676-677
- https://doi.org/10.1063/1.90461
Abstract
A new procedure is proposed for the analysis of thick‐target x‐ray yield data from a proton‐induced x‐ray emission technique.This publication has 9 references indexed in Scilit:
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