The morphology of thick evaporated aluminium films and their purity as determined by proton-induced x-ray analysis
- 1 July 1977
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 44 (1) , 29-42
- https://doi.org/10.1016/0040-6090(77)90025-6
Abstract
No abstract availableKeywords
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