Purity and morphology of aluminium films
- 1 December 1975
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 30 (2) , 267-279
- https://doi.org/10.1016/0040-6090(75)90091-7
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- Proton-induced X-ray cross sections for selected elements Fe to As and applications of X-ray analysis to semiconductor systemsThin Solid Films, 1973
- X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition ProbabilitiesReviews of Modern Physics, 1972
- Deposition of Aluminum from an Electron Beam SourceJournal of Vacuum Science and Technology, 1972
- Photon cross sections from 1 keV to 100 MeV for elements Z=1 to Z=100Atomic Data and Nuclear Data Tables, 1970
- Tables for born approximation calculations of K- and L-shell ionization by protons and other charged particlesAtomic Data and Nuclear Data Tables, 1969