Accumulator-based compaction of test responses
- 1 June 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 42 (6) , 643-650
- https://doi.org/10.1109/12.277285
Abstract
An accumulator-based compaction (ABC) scheme for parallel compaction of test responses is introduced. The asymptotic and transient coverage drop introduced by accumulators with binary and 1's complement adders is studied using Markov chain models. It is proven that the asymptotic coverage drop in ABC with binary adders is 2/sup -k/, where k is the number of bits in the adder that the fault can reach. In ABC with 1's complement adders, the asymptotic coverage drop for a fairly general class of faults is (2n-1)/sup -1/, where n is the total number of bits. The analysis of transient behavior relates the coverage drop with the probability of fault injection, the size of the accumulator, and the length of the test experiment. The process is characterized by damping factors derived for various values of these parameters.Keywords
This publication has 11 references indexed in Scilit:
- Aliasing and Diagnosis Probability in MISR and STUMPS Using a General Error ModelPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- The analysis of one-dimensional linear cellular automata and their aliasing propertiesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1990
- Analysis of checksums, extended-precision checksums, and cyclic redundancy checksIEEE Transactions on Computers, 1990
- A flexible module library for custom DSP applications in a multiprocessor environmentIEEE Journal of Solid-State Circuits, 1990
- An analytical model for the aliasing probability in signature analysis testingIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989
- Bounds and analysis of aliasing errors in linear feedback shift registersIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- Accumulator Compression TestingIEEE Transactions on Computers, 1986
- Testing by Feedback Shift RegisterIEEE Transactions on Computers, 1980
- Syndrome-Testable Design of Combinational CircuitsIEEE Transactions on Computers, 1980
- Measures of the Effectiveness of Fault Signature AnalysisIEEE Transactions on Computers, 1980