Self-diagnosis of failures in VLSI tree array processors
- 1 January 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 40 (11) , 1252-1257
- https://doi.org/10.1109/12.102828
Abstract
No abstract availableKeywords
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- Wafer-scale integration and two-level pipelined implementations of systolic arraysJournal of Parallel and Distributed Computing, 1984
- The Diogenes Approach to Testable Fault-Tolerant Arrays of ProcessorsIEEE Transactions on Computers, 1983