Surface Core-Level Photoelectron Diffraction from Si Dimers at the Si(001)-() Surface
- 3 April 1995
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 74 (14) , 2756-2759
- https://doi.org/10.1103/physrevlett.74.2756
Abstract
Intensity variations of the dimer derived surface shifted Si core level from single domain Si(001)-( ) have been measured as a function of azimuthal angle. Comparisons to multiple scattering calculations show that such measurements provide a method for determining the structural origins of surface shifted core levels. In addition, a structural analysis illustrates the sensitivity of this method to the detailed structure around the emitting atoms. In this case, a determination of the surface geometry indicates that the dimer bond is tilted 19.0° with respect to the surface.
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