Frequency dispersion of sidegating transconductance of GaAs junction field-effect transistors
- 15 December 1985
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 47 (12) , 1285-1287
- https://doi.org/10.1063/1.96306
Abstract
The complex low-frequency sidegating transconductance of GaAs enhancement-mode junction field-effect transistors exhibits dc bias-dependent resonance and relaxation characteristics. These are attributed to the dynamic balance between emission and trapping of electrons by deep energy levels with activation energies of 0.5 and 0.7 eV located at the surface or within the semi-insulating GaAs substrate.Keywords
This publication has 9 references indexed in Scilit:
- Shielding of backgating effects in GaAs integrated circuitsIEEE Electron Device Letters, 1985
- The roles of the surface and bulk of the semi-insulating substrate in low-frequency anomalies of GaAs integrated circuitsIEEE Transactions on Electron Devices, 1985
- Experimental evaluation of low-frequency oscillations in undoped GaAs to probe deep level parametersApplied Physics Letters, 1985
- Mechanism of surface conduction in semi-insulating GaAsApplied Physics Letters, 1984
- Characterization of electron traps in ion-implanted GaAs MESFET's on undoped and Cr-doped LEC semi-insulating substratesIEEE Transactions on Electron Devices, 1983
- Current oscillations in semi-insulating GaAs associated with field-enhanced capture of electrons by the major deep donor EL2Applied Physics Letters, 1982
- Backgating in GaAs MESFET'sIEEE Transactions on Electron Devices, 1982
- Carrier injection and backgating effect in GaAs MESFET'sIEEE Electron Device Letters, 1982
- Femtojoule high speed planar GaAs E-JFET logicIEEE Transactions on Electron Devices, 1978