Auger quantitative analysis of brass via target factor analysis

This publication has 13 references indexed in Scilit:

• Electron irradiation of silicon dioxide: a non-destructive measurement of the in-depth induced compositional changes
  Applied Surface Science, 1992
• AES and factor analysis study of cord‐oxidized brass layers and rubber‐to‐brass interface chemical composition
  Surface and Interface Analysis, 1991
• Application of factor analysis to the AES and XPS study of the oxidation of chromium
  Surface and Interface Analysis, 1990
• Bombardment-induced segregation of Cu in Pt-Cu alloy observed using different energy Auger line combinations
  Applied Physics A, 1990
• Auger quantitative analysis and preferential sputtering in brass alloys
  Vacuum, 1990
• Factor analysis and superposition of Auger electron spectra applied to room temperature oxidation of Ni and NiCr21Fe12
  Surface and Interface Analysis, 1989
• The Theory of the Preferential Sputtering of Alloys, Including the Role of Gibbsian Segregation
  Published by Springer Nature ,1986
• Ion induced surface compositional changes of α brass; a comparative study by AES and sputtered thermal ion mass spectrometry. Application to quantitative AES
  Surface and Interface Analysis, 1985
• Sputtering of multicomponent materials
  Published by Springer Nature ,1983
• Principal component analysis of Auger line shapes at solid—solid interfaces
  Applications of Surface Science, 1981