A perspective on ellipsometry
- 30 June 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 56, 6-18
- https://doi.org/10.1016/0039-6028(76)90430-1
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
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- An automated scanning ellipsometerSurface Science, 1976
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- Polarization Transfer Function of an Optical System as a Bilinear Transformation*Journal of the Optical Society of America, 1972
- Dual-Mode Reflectometer for Measuring Microwave Magnetic Kerr Effect in SemiconductorsIEEE Transactions on Microwave Theory and Techniques, 1967
- Photoelectric Analysis of Polarized LightApplied Optics, 1962
- Light Scattering in the Atmosphere and the Polarization of Sky Light*Journal of the Optical Society of America, 1957