Generalized rotating-compensator ellipsometry
- 30 June 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 56, 148-160
- https://doi.org/10.1016/0039-6028(76)90442-8
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
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- Application of generalized ellipsometry to anisotropic crystalsJournal of the Optical Society of America, 1975
- Analysis of systematic errors in rotating-analyzer ellipsometers*Journal of the Optical Society of America, 1974
- Ellipsometry of anisotropic thin filmsJournal of the Optical Society of America, 1974
- Application of generalized ellipsometry to anisotropic crystals*Journal of the Optical Society of America, 1974
- Ellipsometry of anisotropic surfacesJournal of the Optical Society of America, 1973
- The fixed-polarizer nulling scheme in generalized ellipsometryOptics Communications, 1973
- Ellipsometric Measurement of the Polarization Transfer Function of an Optical System*Journal of the Optical Society of America, 1972