Material property characterization and integration issues for mesoporous silica
- 20 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Study of ultra-thin hydrogen silsesquioxane films using X-ray reflectivityThin Solid Films, 1998
- Ion Beam Techniques for Low K Materials CharacterizationMRS Proceedings, 1998
- Particle-Packing Phenomena and Their Application in Materials ProcessingMRS Bulletin, 1997
- Measurement of Hole Volume in Amorphous Polymers Using Positron SpectroscopyMacromolecules, 1996