ELECTRICAL CONDUCTION IN SINGLE-CRYSTAL ALUMINUM THIN FILMS
- 1 September 1969
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 15 (5) , 150-152
- https://doi.org/10.1063/1.1652945
Abstract
Electrical conduction in thin (400−1500 Å) single‐crystal aluminum films vacuum evaporated on NaCl substrates is explained by a simple model and verified by experimental results. The resistivity of the inter‐island boundaries is accounted for by considering the film structure as a metal—insulator matrix and calculating its equivalent resistivity. An unambiguous comparison can then be made with the Fuchs—Sondheimer theory of size‐affected conduction in thin metal films only after subtracting off the resistivity contribution due to interisland boundaries.Keywords
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