Linearization of polycrystalline film gauge factors
- 1 January 1979
- journal article
- Published by EDP Sciences in Revue de Physique Appliquée
- Vol. 14 (8) , 743-747
- https://doi.org/10.1051/rphysap:01979001408074300
Abstract
A linearized equation is proposed to describe the thickness dependence of the polycrystalline film gauge factor γF. Finally the theoretical variation of γF is represented by a general equation whose form is similar to those related to linearized equations previously derived for analyzing polycrystalline film resistivity and T.C.R. Comparisons of exact and approximate values indicate a deviation less than 10 % over large ranges of the surface scattering specularity parameter, p, the average random distance between grain boundaries, ag, and the ratio, k, of the film thickness to background mean free pathKeywords
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