Resolution limits in annular dark field STEM
Open Access
- 2 November 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 47 (1-3) , 173-186
- https://doi.org/10.1016/0304-3991(92)90194-o
Abstract
No abstract availableKeywords
This publication has 25 references indexed in Scilit:
- Thermal vibrations in convergent-beam electron diffractionActa Crystallographica Section A Foundations of Crystallography, 1991
- High-resolution incoherent imaging of crystalsPhysical Review Letters, 1990
- Accurate Structure-Factor Phase Determination by Electron Diffraction in Noncentrosymmetric CrystalsPhysical Review Letters, 1989
- Chemically sensitive structure-imaging with a scanning transmission electron microscopeNature, 1988
- Visibility of single heavy atoms on thin crystalline silicon in simulated annular dark-field STEM imagesActa Crystallographica Section A Foundations of Crystallography, 1988
- Bonding in GaAsPhysical Review Letters, 1988
- Experimental energy-loss function,, for aluminumPhysical Review B, 1983
- Image Contrast And Localized Signal Selection TechniquesJournal of Microscopy, 1979
- Reciprocity in electron diffraction and microscopyActa Crystallographica Section A, 1968
- Diffraction channelling of fast electrons and positrons in crystalsPhilosophical Magazine, 1966