Hardness Assurance Considerations for the Neutron Environment
- 1 January 1975
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 22 (6) , 2308-2313
- https://doi.org/10.1109/tns.1975.4328124
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Statistical distribution of neutron semiconductor device degradationIEEE Transactions on Nuclear Science, 1974
- Analytical Techniques for the Determination of Equipment Probability of Survival to Radiation StressIEEE Transactions on Nuclear Science, 1972
- Radiation Hardening of Electronic Systems Invited PaperIEEE Transactions on Nuclear Science, 1969
- Statistical Modeling of Semiconductor Devices for the Tree EnvironmentIEEE Transactions on Nuclear Science, 1968
- The Effects of Neutron Irradiation on Germanium and SiliconProceedings of the IRE, 1958
- Large-Signal Behavior of Junction TransistorsProceedings of the IRE, 1954